STM32F10xxx JTAG TAP问题求助!

2019-07-14 18:12发布

为了访问Cortex ™ -M3 TAP 对芯片进行调试,必须:
1. First, it is necessary to shift the BYPASS instruction of the boundary scan TAP.
2. Then, for each IR shift, the scan chain contains 9 bits (=5+4) and the unused TAP instruction must be shifted in  using the BYPASS instruction.
3.  For each data shift, the unused TAP, which is in BYPASS mode, adds 1 extra data bit in the data scan chain.

Note: Important : Once Serial-Wire is selected using the dedicated ARM JTAG sequence, the boundary scan TAP is automatically disabled (JTMS forced high)。


以上该如何理解???

现在IDCODE可以读到,但是读写有问题。
①for each IR shift, the scan chain contains 9 bits (=5+4) and the unused TAP instruction must be shifted in  using the BYPASS instruction.
该如何实现?

②For each data shift, the unused TAP, which is in BYPASS mode, adds 1 extra data bit in the data scan chain.
adds 1 extra data bit是放在最后移入吗?
该如何实现正确读写?

请教大神指导指导!
是否有Demo可供参考?


友情提示: 此问题已得到解决,问题已经关闭,关闭后问题禁止继续编辑,回答。
该问题目前已经被作者或者管理员关闭, 无法添加新回复
9条回答
Sabrina_cc
1楼-- · 2019-07-15 21:10
 精彩回答 2  元偷偷看……
houjunhao33
2楼-- · 2019-07-15 23:42
7楼已经翻译出来了啊!!!!!!
freesea123
3楼-- · 2019-07-16 03:01
 这个TAP好像是用来做调试工具的吧

一周热门 更多>